Design of Failure-censored Accelerated Life Test Sampling Plans for Lognormal and Weibull Distributions

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dc.contributor.authorBai, Do Sunko
dc.contributor.authorj. g. kimko
dc.contributor.authory. r. chunko
dc.date.accessioned2013-02-25T11:59:55Z-
dc.date.available2013-02-25T11:59:55Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1993-
dc.identifier.citationENGINEERING OPTIMIZATION, v.21, no.2, pp.197 - 212-
dc.identifier.issn0305-215X-
dc.identifier.urihttp://hdl.handle.net/10203/62047-
dc.languageEnglish-
dc.publisherTaylor & Francis Ltd-
dc.titleDesign of Failure-censored Accelerated Life Test Sampling Plans for Lognormal and Weibull Distributions-
dc.typeArticle-
dc.identifier.scopusid2-s2.0-33749541601-
dc.type.rimsART-
dc.citation.volume21-
dc.citation.issue2-
dc.citation.beginningpage197-
dc.citation.endingpage212-
dc.citation.publicationnameENGINEERING OPTIMIZATION-
dc.contributor.nonIdAuthorj. g. kim-
dc.contributor.nonIdAuthory. r. chun-
dc.subject.keywordAuthoraccelerated life test-
dc.subject.keywordAuthorasymptotic theory-
dc.subject.keywordAuthorfailure-censoring-
dc.subject.keywordAuthorgeneralized asymptotic variance-
dc.subject.keywordAuthorlife-test sampling plan-
dc.subject.keywordAuthormaximum likelihood method-
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