Browse "CH-Journal Papers(저널논문)" by Subject ToF-SIMS
Showing results 1 to 3 of 3
Chemical Imaging Analysis of the Micropatterns of Proteins and Cells Using Cluster Ion Beam-based Time-of-Flight Secondary Ion Mass Spectrometry and Principal Component Analysis Shon, Hyun Kyong; Son, Jin Gyeong; Lee, Kyung-Bok; Kim, Jinmo; Kim, Myung Soo; Choi, Insung; Lee, Tae Geol, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.34, no.3, pp.815 - 819, 2013-03 |
| Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers Son, Jin Gyeong; Shon, Hyun Kyong; Choi, Changrok; Han, Sang Woo; Lee, Tae Geol, SURFACE AND INTERFACE ANALYSIS, v.46, pp.110 - 114, 2014-11 |
| Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS Min, H; Jung, G; Moon, DW; Choi, Insung; Lee, TG, APPLIED SURFACE SCIENCE, v.255, no.4, pp.1037 - 1039, 2008-12 |
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