Browse "CH-Journal Papers(저널논문)" by Subject BOMBARDMENT
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Chemical Imaging Analysis of the Micropatterns of Proteins and Cells Using Cluster Ion Beam-based Time-of-Flight Secondary Ion Mass Spectrometry and Principal Component Analysis Shon, Hyun Kyong; Son, Jin Gyeong; Lee, Kyung-Bok; Kim, Jinmo; Kim, Myung Soo; Choi, Insung; Lee, Tae Geol, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.34, no.3, pp.815 - 819, 2013-03 |
| Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopy Moon, DW; Ha, YH; Kim, HK; Kim, KJ; Kim, HS; Lee, JeongYong; Kim, Sehun, APPLIED SURFACE SCIENCE, v.150, no.1-4, pp.235 - 243, 1999-08 |
| Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling Shon, HK; Lee, KB; Kim, J; Choi, Insung; Moon, DW; Lee, TG, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.24, no.4, pp.1203 - 1207, 2006-07 |
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