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Keto defect sites in fluorene-based organic field-effect transistors: The origin of rapid degradation on the performance of the device

Noh, Yong-Young; Kim, Dong-Yu; Yoshida, Yuji; Yase, Kiyoshi; Jung, Byung-Jun; Lim, Eunhee; Shim, Hong Ku; et al, JOURNAL OF APPLIED PHYSICS, v.97, no.10, pp.104504-1 - 104504-7, 2005-05

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