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Heavy-Ion radiation characteristics of DDR2 synchronous dynamic random access memory fabricated in 56 nm technology Ryu, KwangSun; Park, MiYoung; Chae, JangSoo; Lee, In; Uchihori, Yukio; Kitamura, Hisashi; Takashima, Takeshi, Journal of Astronomy and Space Science, v.29, no.3, pp.315 - 320, 2012-09 |
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