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NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
LOCA Uncertainty Analysis Using the Fourier Amplitude Sensitivity Test and the Stepwise Regression Technique

Kim, Tae Woon; Lee, Byung Ho; Chang, Soon-Heung, TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.53, pp.344 - 346, 1986

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