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Browse "NE-Journal Papers(저널논문)" by Author Kim, Tae Woon

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1	LOCA Uncertainty Analysis Using the Fourier Amplitude Sensitivity Test and the Stepwise Regression Technique Kim, Tae Woon; Lee, Byung Ho; Chang, Soon-Heung, TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, v.53, pp.344 - 346, 1986

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