Showing results 1 to 2 of 2
Data analysis scheme for correcting general misalignments of an optics configuration for a voltage measurement system based on the Pockels electro-optic effect Choi, Seongmin; Lee, Dong-Geun; Woo, H. J.; Hong, S. H.; Ham, Seunggi; Ryu, Jonghyeon; Chung, Kyoung-Jae; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.92, no.4, 2021-04 |
Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
Discover