Browse "NE-Conference Papers(학술회의논문)" by Author Ghim, Young Chul

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Sensitivity test of atomic data utilized in Li-BES data analysis using Bayesian inference

Jeong, Chung sun; Kwak, Sehyun; Svensson, J; Brix, M; Ghim, Young Chul, Korean Nuclear Society Spring Conference, Korean Nuclear Society, 2016-05-13

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