MS-Journal Papers(저널논문)

Recent Items

Collection's Items (Sorted by Submit Date in Descending order): 4901 to 4920 of 7245

4901
Characteristics of Pt/SrTiO3/Pb(Zr-0.52, Ti-0.48)O-3/SrTiO3/Si ferroelectric gate oxide structure

Shin, DS; Park, ST; Choi, HS; Choi, IH; Lee, JeongYong, THIN SOLID FILMS, v.354, no.1-2, pp.251 - 255, 1999-10

4902
Comparison of the stress between rapid thermal annealed and excimer laser annealed polycrystalline silicon thin films

Lee, CW; Ko, MK; Woo, SL; Oh, HW; Gho, SJ; Lee, JeongYong, SOLID STATE COMMUNICATIONS, v.105, no.12, pp.777 - 781, 1998-03

4903
알루미나와 Ag-33.5Cu-1.5Ti 브레이징 합금 계면에서 생성되는 반응층의 미세 조직 관찰과 상 동정

최시경; 권순용, 한국세라믹학회지, v.33, no.9, pp.1045 - 1049, 1996-09

4904
Formation of CuPt-type ordered (Cd, Zn)Te at CdTe/ZnTe interface

Kwon, MS; Lee, JeongYong, JOURNAL OF CRYSTAL GROWTH, v.191, no.1-2, pp.51 - 58, 1998-07

4905
Influence of vacuum-annealing on the diffusion barrier properties of MOCVD TiN for Cu metallization

Lee, JG; Cho, HL; Lee, E; Lee, JeongYong; Kim, K; Lee, JM, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S65 - S70, 1999-07

4906
Effect of substrate temperature on the texture and structure of polycrystalline Si0.7Ge0.3 films deposited on SiO2 by molecular beam deposition

Kim, HS; Lee, JeongYong, THIN SOLID FILMS, v.350, no.1-2, pp.14 - 20, 1999-08

4907
Dynamic behaviour of domains during poling by acoustic emission measurements in La-modified PbTiO3 ferroelectric ceramics

Choi, DG; Choi, Si-Kyung, JOURNAL OF MATERIALS SCIENCE, v.32, no.2, pp.421 - 425, 1997-01

4908
Etch-induced damage in single crystal Si trench etching by planar inductively coupled Cl-2/N-2 and Cl-2/HBr plasmas

Lee, JeongYong; Hwang, SW; Yeom, GY; Lee, JW; Lee, JY, THIN SOLID FILMS, v.341, no.1-2, pp.168 - 171, 1999-03

4909
Effects of growth temperature and surface treatment on growth orientation and interface structure during molecular beam epitaxy of CdTe on (0 0 1)GaAs

Kwon, MS; Lee, JeongYong; Kim, MD; Kang, TW, JOURNAL OF CRYSTAL GROWTH, v.186, no.1-2, pp.79 - 84, 1998-03

4910
텅스텐(W)이 함유된 25 Cr이상(二相) 스테인리스강의 부식특성에 미치는 475℃ 시효처리의 영향

박찬진; 김준식; 권혁상, 대한금속·재료학회지, v.37, no.11, pp.1390 - 1398, 1999-11

4911
Fabrication and characterization of InGaN nano-scale dots for blue and green LED applications

Kim, KS; Hong, CH; Lee, WH; Kim, CS; Cha, OH; Yang, GM; Suh, EK; et al, MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH, v.5, pp.11 - 74, 2000-01

4912
Lattice mismatch and atomic structure studies on InxGa1-xAs/In(y)Al(1-y)AS coupled double-step quantum wells

Kim, TW; Lee, DU; Lim, YS; Lee, JeongYong; Yoo, KH; Kim, MD, APPLIED SURFACE SCIENCE, v.153, no.2-3, pp.102 - 107, 2000-01

4913
High-quality epitaxial growth of in situ phosphorus-doped Si films by promoting dispersion of native oxides in alpha-Si

Kim, HS; Shim, KH; Lee, SY; Lee, JeongYong; Kang, JY, JOURNAL OF CRYSTAL GROWTH, v.212, no.3-4, pp.423 - 428, 2000-05

4914
Structure and chemical characteristics of tin oxide films prepared by reactive-ion-assisted deposition as a function of oxygen ion beam energy

Song, SK; Kim, D; Kim, S; Koh, SK; Jung, HJ; Lee, JeongYong; Baik, HK, JOURNAL OF MATERIALS RESEARCH, v.15, no.9, pp.1911 - 1921, 2000-09

4915
Observation of phase separation and ordering in the InAlAs epilayer grown on InP at the low temperature

Cho, HK; Lee, JeongYong; Kwon, MS; Lee, B; Baek, JH; Han, WS, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.64, no.3, pp.174 - 179, 1999-10

4916
ORIGIN OF INTRINSIC STRESS IN Y2O3 FILMS DEPOSITED BY REACTIVE SPUTTERING

CHOI, HM; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.13, no.6, pp.2832 - 2835, 1995-11

4917
Surface characterization of diamond films polished by thermomechanical polishing method

Choi, Si-Kyung; Jung, DY; Kweon, SY; Jung, SK, THIN SOLID FILMS, v.279, no.1-2, pp.110 - 114, 1996-06

4918
Effect of nitrogen on the dynamic strain ageing behaviour of type 316L stainless steel

Kim, DW; Ryu, WS; Hong, JH; Choi, Si-Kyung, JOURNAL OF MATERIALS SCIENCE, v.33, no.3, pp.675 - 679, 1998-02

4919
Influence of residual stress and film thickness on crystallographic orientation in Al thin films deposited by bias sputtering

Choi, HM; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.16, no.6, pp.3348 - 3351, 1998-11

4920
Effects of post annealing and oxidation processes on the removal of damage generated during the shallow trench etch process

Lee, YJ; Hwang, SW; Oho, KH; Lee, JeongYong; Yeom, GY, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.37, no.12B, pp.6916 - 6921, 1998-12

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