Kang, Seung-Mo; Shin, Jung Ho; Kim, Jeong Hyeon; Kang, Hyun Seok; Jung, Chang Kyu; Lee, Han Eol; Bae, Byeong-Soo, Nano Energy, v.127, 2024-08
Baek, Ji Hyun; Im, In Hyuk; Hur, Eun-Mi; Park, Jungwon; Lim, Jongwoo; Kim, Sangbum; Kang, Kibum; Kim, SY; Song, JY; Jang, Ho Won, MATERIALS RESEARCH BULLETIN, v.176, 2024-08
Park, Hyeonghun; Seol, Woojun; Park, Geumyong; Anoop, Gopinathan; Kim, Juhun; Tamulevicius, Tomas; Tamulevicius, Sigitas; Joo, Soyun; HONG, DANIEL SEUNGBUM; Jo, Ji Young; Kim, Hyeong-Jin, APPLIED SURFACE SCIENCE, v.660, 2024-07
Choi, Minhyuk; Oh, Saeyoung; Hahn, Sungsoo; Ji, Yubin; Jo, Min-kyung; Kim, Jeongtae; Ju, Tae-Seong; Kim, Gyeongbo; Gyeon, MinSeung; Lee, Yuhwa; Do, Jeonghyeon; Choi, Seungwook; Kim, Ansoon; Yang, Seungmo; Hwang, Chanyong; Kim, Kab-Jin; Cho, Doohee; Kim, Changyoung; Kang, Kibum; Jeong, Hu Young; Song, Seungwoo, ACS Nano, v.18, no.23, pp.15154 - 15166, 2024-06
Kim, TaeSoo; Noh, Gichang; Kwon, Seongdae; Kim, Ji Yoon; Dhakal, Krishna P.; Oh, Saeyoung; Chai, Hyun-Jun; Park, Eunpyo; Kim, In Soo; Lee, Eunji; Kim, Youngbum; Lee, Jaehyun; Jo, Min-kyung; Kang, MinSoo; Park, Cheolmin; Kim, Jeongho; Park, Jeongwon; Kim, Suhyun; Kim, Mingyu; Kim, Yuseok; Choi, Sung-Yool; Song, Seungwoo; Jeong, Hu-Young; Kim, Jeongyong; Kwak, Joon Young; Kang, Kibum, ADVANCED FUNCTIONAL MATERIALS, v.34, no.23, 2024-06
Wang, Xuejing; Kim, Kyungtae; Derby, Benjamin K.; McGuckin, Terrence; Calderon, Gabriel A.; Pettes, Michael T.; Hwang, Jinwoo; Kim, Yeonhoo; Park, Jeongwon; Chen, Aiping; Kang, Kibum; Yoo, Jinkyoung, NANOSCALE, v.16, no.23, pp.11156 - 11162, 2024-06
Jung, Heechan; Lee, Sangwon; Kang, Taehyeok; Zargaran, Alireza; Choi, Pyuck-Pa; Sohn, Seok Su, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.181, pp.71 - 81, 2024-05
Pornnoppadol, Gahsidit; Cho, Soojeong; Yu, Jeong Heon; Kim, Shin-Hyun; Nam, Yoon Sung, MOLECULAR SYSTEMS DESIGN & ENGINEERING, v.9, no.5, pp.507 - 517, 2024-05
Lee, Jeong-A; Cho, Yoonhan; Kim, Saehun; Kweon, Seong Hyeon; Kang, Haneul; Byun, Jeong Hwan; Kwon, Eunji; Seo, Samuel; Ryu, Kyoung Han; Kim, Wonkeun; Kwak, Sang Kyu; Choi, Nam-Soon; HONG, DANIEL SEUNGBUM, ADVANCED SCIENCE, v.11, no.17, 2024-05
Oh, Jimin; Yeom, Jiwon; Madika, Benediktus; Kim, Kwang Man; Liow, Chi Hao; Agar, Joshua C; Hong, Seungbum, NPJ COMPUTATIONAL MATERIALS, v.10, no.1, 2024-05
Characteristics of Pt/SrTiO3/Pb(Zr-0.52, Ti-0.48)O-3/SrTiO3/Si ferroelectric gate oxide structure Shin, DS; Park, ST; Choi, HS; Choi, IH; Lee, JeongYong, THIN SOLID FILMS, v.354, no.1-2, pp.251 - 255, 1999-10 |
Comparison of the stress between rapid thermal annealed and excimer laser annealed polycrystalline silicon thin films Lee, CW; Ko, MK; Woo, SL; Oh, HW; Gho, SJ; Lee, JeongYong, SOLID STATE COMMUNICATIONS, v.105, no.12, pp.777 - 781, 1998-03 |
알루미나와 Ag-33.5Cu-1.5Ti 브레이징 합금 계면에서 생성되는 반응층의 미세 조직 관찰과 상 동정 최시경; 권순용, 한국세라믹학회지, v.33, no.9, pp.1045 - 1049, 1996-09 |
Formation of CuPt-type ordered (Cd, Zn)Te at CdTe/ZnTe interface Kwon, MS; Lee, JeongYong, JOURNAL OF CRYSTAL GROWTH, v.191, no.1-2, pp.51 - 58, 1998-07 |
Influence of vacuum-annealing on the diffusion barrier properties of MOCVD TiN for Cu metallization Lee, JG; Cho, HL; Lee, E; Lee, JeongYong; Kim, K; Lee, JM, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S65 - S70, 1999-07 |
Effect of substrate temperature on the texture and structure of polycrystalline Si0.7Ge0.3 films deposited on SiO2 by molecular beam deposition Kim, HS; Lee, JeongYong, THIN SOLID FILMS, v.350, no.1-2, pp.14 - 20, 1999-08 |
Dynamic behaviour of domains during poling by acoustic emission measurements in La-modified PbTiO3 ferroelectric ceramics Choi, DG; Choi, Si-Kyung, JOURNAL OF MATERIALS SCIENCE, v.32, no.2, pp.421 - 425, 1997-01 |
Etch-induced damage in single crystal Si trench etching by planar inductively coupled Cl-2/N-2 and Cl-2/HBr plasmas Lee, JeongYong; Hwang, SW; Yeom, GY; Lee, JW; Lee, JY, THIN SOLID FILMS, v.341, no.1-2, pp.168 - 171, 1999-03 |
Effects of growth temperature and surface treatment on growth orientation and interface structure during molecular beam epitaxy of CdTe on (0 0 1)GaAs Kwon, MS; Lee, JeongYong; Kim, MD; Kang, TW, JOURNAL OF CRYSTAL GROWTH, v.186, no.1-2, pp.79 - 84, 1998-03 |
텅스텐(W)이 함유된 25 Cr이상(二相) 스테인리스강의 부식특성에 미치는 475℃ 시효처리의 영향 박찬진; 김준식; 권혁상, 대한금속·재료학회지, v.37, no.11, pp.1390 - 1398, 1999-11 |
Fabrication and characterization of InGaN nano-scale dots for blue and green LED applications Kim, KS; Hong, CH; Lee, WH; Kim, CS; Cha, OH; Yang, GM; Suh, EK; et al, MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH, v.5, pp.11 - 74, 2000-01 |
Lattice mismatch and atomic structure studies on InxGa1-xAs/In(y)Al(1-y)AS coupled double-step quantum wells Kim, TW; Lee, DU; Lim, YS; Lee, JeongYong; Yoo, KH; Kim, MD, APPLIED SURFACE SCIENCE, v.153, no.2-3, pp.102 - 107, 2000-01 |
High-quality epitaxial growth of in situ phosphorus-doped Si films by promoting dispersion of native oxides in alpha-Si Kim, HS; Shim, KH; Lee, SY; Lee, JeongYong; Kang, JY, JOURNAL OF CRYSTAL GROWTH, v.212, no.3-4, pp.423 - 428, 2000-05 |
Structure and chemical characteristics of tin oxide films prepared by reactive-ion-assisted deposition as a function of oxygen ion beam energy Song, SK; Kim, D; Kim, S; Koh, SK; Jung, HJ; Lee, JeongYong; Baik, HK, JOURNAL OF MATERIALS RESEARCH, v.15, no.9, pp.1911 - 1921, 2000-09 |
Observation of phase separation and ordering in the InAlAs epilayer grown on InP at the low temperature Cho, HK; Lee, JeongYong; Kwon, MS; Lee, B; Baek, JH; Han, WS, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.64, no.3, pp.174 - 179, 1999-10 |
ORIGIN OF INTRINSIC STRESS IN Y2O3 FILMS DEPOSITED BY REACTIVE SPUTTERING CHOI, HM; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.13, no.6, pp.2832 - 2835, 1995-11 |
Surface characterization of diamond films polished by thermomechanical polishing method Choi, Si-Kyung; Jung, DY; Kweon, SY; Jung, SK, THIN SOLID FILMS, v.279, no.1-2, pp.110 - 114, 1996-06 |
Effect of nitrogen on the dynamic strain ageing behaviour of type 316L stainless steel Kim, DW; Ryu, WS; Hong, JH; Choi, Si-Kyung, JOURNAL OF MATERIALS SCIENCE, v.33, no.3, pp.675 - 679, 1998-02 |
Influence of residual stress and film thickness on crystallographic orientation in Al thin films deposited by bias sputtering Choi, HM; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.16, no.6, pp.3348 - 3351, 1998-11 |
Effects of post annealing and oxidation processes on the removal of damage generated during the shallow trench etch process Lee, YJ; Hwang, SW; Oho, KH; Lee, JeongYong; Yeom, GY, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.37, no.12B, pp.6916 - 6921, 1998-12 |
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