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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Surface and interface microstructural properties of Ru thin films grown on InSb (111) substrates at room temperature Kim, TW; Lee, DU; Lee, JH; Yoon, YS; Lee, JeongYong; Park, HL, APPLIED SURFACE SCIENCE, v.161, no.3-4, pp.452 - 458, 2000-07 | |
| Effect of thermal annealing on the surface and the microstructural properties of ZnO thin films grown on p-Si (100) substrates Kim, TW; Lee, KH; Lee, HS; Lee, JeongYong; Kang, SG; Kim, DW; Cho, WJ, JOURNAL OF CRYSTAL GROWTH, v.262, pp.72 - 77, 2004-02 | |
| Effect of thermal annealing on microstructural properties of Ti/Ge2Sb2Te5/Ti thin films deposited on SiO2/Si substrates by a sputtering method Kim, SY; Lee, HS; Chung, IS; Park, YJ; Lee, JeongYong; Kim, TW, APPLIED SURFACE SCIENCE, v.253, no.8, pp.4041 - 4044, 2007-02 | |
| Growth and structural properties of ZnO films on (10-10) m-plane sapphire substrates by plasma-assisted molecular beam epitaxy Kim, Jung-Hyun; Han, Seok Kyu; Hong, Sun Ig; Hong, Soon-Ku; Lee, Jae Wook; Lee, JeongYong; Song, Jung-Hoon; Park, Jin Sub; Yao, Takafumi, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.27, pp.1625 - 1630, 2009-05 | |
| Formation mechanism of preferential c-axis oriented ZnO thin films grown on p-Si substrates Lee, HS; Lee, JeongYong; Kim, TW, JOURNAL OF MATERIALS SCIENCE, v.39, pp.3525 - 3528, 2004-05 | |
| Improvement of electrical properties of ferroelectric gate oxide structure by using Al2O3 thin films as buffer insulator Choi, HS; Lim, GS; Lee, JH; Kim, YT; Kim, SI; Yoo, DC; Lee, JeongYong; Choi, IH, THIN SOLID FILMS, v.444, no.1-2, pp.276 - 281, 2003-11 | |
| Correlation between the ordered structure and the valence-band splitting in highly strained CdxZn1-xTe epilayers Kim, TW; Kwack, KD; Park, JG; Lee, HS; Lee, JeongYong; Jang, MS; Park, HL, APPLIED PHYSICS LETTERS, v.83, pp.269 - 271, 2003-07 | |
| Crystallization behavior of ferroelectric YMnO3 thin films on Si(100) substrates Yoo, DC; Lee, JeongYong; Kim, IS; Kim, YT, JOURNAL OF CRYSTAL GROWTH, v.234, no.2-3, pp.454 - 458, 2002-01 | |
| Existence of the CuPt-type ordering due to the surface undulation in CdxZn1-xTe epilayers grown on ZnTe buffer layers Lee, HS; Lee, JeongYong; Kim, TW; Lee, I; Park, HL, JOURNAL OF APPLIED PHYSICS, v.95, pp.6054 - 6057, 2004-06 | |
| Two-layer crystallization of amorphous YMnO3 thin films on Si(100) substrates Yoo, DC; Lee, JeongYong; Kim, IS; Kim, YT, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.86, pp.149 - 151, 2003-01 |
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