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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Effects of stress on solid-phase epitaxial regrowth and corner defect generation in As+-implanted, two-dimensional amorphized Si Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JOURNAL OF CRYSTAL GROWTH, v.231, no.1-2, pp.107 - 114, 2001-09 | |
| Effect of thermal annealing on the surface and the microstructural properties of ZnO thin films grown on p-Si (100) substrates Kim, TW; Lee, KH; Lee, HS; Lee, JeongYong; Kang, SG; Kim, DW; Cho, WJ, JOURNAL OF CRYSTAL GROWTH, v.262, pp.72 - 77, 2004-02 | |
| Effect of thermal annealing on microstructural properties of Ti/Ge2Sb2Te5/Ti thin films deposited on SiO2/Si substrates by a sputtering method Kim, SY; Lee, HS; Chung, IS; Park, YJ; Lee, JeongYong; Kim, TW, APPLIED SURFACE SCIENCE, v.253, no.8, pp.4041 - 4044, 2007-02 | |
| Growth and structural properties of ZnO films on (10-10) m-plane sapphire substrates by plasma-assisted molecular beam epitaxy Kim, Jung-Hyun; Han, Seok Kyu; Hong, Sun Ig; Hong, Soon-Ku; Lee, Jae Wook; Lee, JeongYong; Song, Jung-Hoon; Park, Jin Sub; Yao, Takafumi, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.27, pp.1625 - 1630, 2009-05 | |
| Crystallization behavior of ferroelectric YMnO3 thin films on Si(100) substrates Yoo, DC; Lee, JeongYong; Kim, IS; Kim, YT, JOURNAL OF CRYSTAL GROWTH, v.234, no.2-3, pp.454 - 458, 2002-01 | |
| Structural and optical investigations of periodically polarity inverted ZnO heterostructures on (0001) Al2O3 Park, J. S.; Goto, T.; Hong, S. K.; Lee, S. H.; Lee, J. W.; Minegishi, T.; Park, S. H.; Chang, J. H.; Oh, D. C.; Lee, JeongYong; Yao, T., APPLIED PHYSICS LETTERS, v.94, no.14, 2009-04 | |
| Microstructural investigation of SexTe100-x thin films deposited on Si(100) substrates by x-ray diffractometer and transmission electron Microscopy analysis Kim, ET; Lee, JeongYong; Kim, YT, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.46, pp.7392 - 7395, 2007-11 | |
| Effects of stress on the microstructure of the corner defect in As+-implanted, two-dimensional amorphized Si Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JOURNAL OF CRYSTAL GROWTH, v.233, no.4, pp.673 - 680, 2001-12 | |
| Effect of annealing on the microstructural and optical properties of InAs quantum dots grown on GaAs buffer layers Lee, KH; Lee, HS; Lee, JeongYong; Lee, DU; Kim, TW; Kim, MD, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.S799 - S802, 2004-12 | |
| In situ transmission electron microscopy study of the nucleation and grain growth of Ge2Sb2Te5 thin films Park, YJ; Lee, JeongYong; Kim, YT, APPLIED SURFACE SCIENCE, v.252, pp.8102 - 8106, 2006-09 |