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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Ultraviolet Photo-Annealing Process for Low Temperature Processed Sol-Gel Zinc Tin Oxide Thin Film Transistors Hwang, Young-Hwan; Seo, Seok-Jun; Jeon, Jun-Hyuck; Bae, Byeong-Soo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.15, no.4, pp.91 - 93, 2012 | |
| Postannealing Process for Low Temperature Processed Sol-Gel Zinc Tin Oxide Thin Film Transistors Seo, Seok-Jun; Hwang, Young-Hwan; Bae, Byeong-Soo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.13, no.10, pp.357 - 359, 2010 | |
| The Effect of Metal Composition on Bias Stability of Solution Processed Indium Oxide Based Thin Film Transistors Hwang, Young Hwan; Im, Hyeon-Gyun; Park, Hyungjin; Nam, Yun-Yong; Bae, Byeong-Soo, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.2, no.11, pp.Q200 - Q204, 2013 | |
| Effects of hydroxyl groups in gate dielectrics on the hysteresis of organic thin film transistors Choi, Chaun Gi; Bae, Byeong-Soo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.10, no.11, pp.H347 - H350, 2007 |