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NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
The Effect of Metal Composition on Bias Stability of Solution Processed Indium Oxide Based Thin Film Transistors

Hwang, Young Hwan; Im, Hyeon-Gyun; Park, Hyungjin; Nam, Yun-Yong; Bae, Byeong-Soo, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.2, no.11, pp.Q200 - Q204, 2013

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