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Impact of Charge-Trap Layer Conductivity Control on Device Performances of Top-Gate Memory Thin-Film Transistors Using IGZO Channel and ZnO Charge-Trap Layer

Bak, Jun Yong; Ryu,Min-Ki; Park, Sang-Hee Ko; Hwang,Chi-Sun; Yoon, Sung Min, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.61, no.7, pp.2404 - 2411, 2014-07

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