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Direct observation of microscopic change induced by oxygen vacancy drift in amorphous TiO2 thin films Jeong, Hu Young; Lee, JeongYong; Choi, Sung-Yool, APPLIED PHYSICS LETTERS, v.97, no.4, 2010-07 |
Role of Interface Reaction on Resistive Switching of Metal/Amorphous TiO2/Al RRAM Devices Jeong, Hu Young; Kim, Sung Kyu; Lee, JeongYong; Choi, Sung-Yool, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.10, pp.979 - 982, 2011 |
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