Browse "MS-Journal Papers(저널논문)" by Subject quantitative oxygen vacancy profile
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| Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
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