Showing results 1 to 14 of 14
Arsenic decapping and half cycle reactions during atomic layer deposition of Al2O3 on In0.53Ga0.47As(001) Shin, Byungha; Clemens, Jonathon B.; Kelly, Michael A.; Kummel, Andrew C.; McIntyre, Paul C., APPLIED PHYSICS LETTERS, v.96, no.25, 2010-06 |
Device reliability under electrical stress and photo response of oxide TFTs Park, Sang-Hee Ko; Ryu, Min-Ki; Yoon, Sung-Min; Yang, Shinhyuk; Hwang, Chi-Sun; Jeon, Jae-Hong, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.10, pp.779 - 788, 2010-10 |
Effect of Passivation on the Sintering Behavior of Submicron Nickel Powder Compacts for MLCC Application Jo, Gi-Young; Lee, Kwi-Jong; Kang, Suk-Joong L, 한국분말야금학회지, v.20, no.6, pp.405 - 410, 2013-12 |
Effects of Sol-Gel Organic-Inorganic Hybrid Passivation on Stability of Solution-Processed Zinc Tin Oxide Thin Film Transistors Seo, Seok-Jun; Yang, Seung-Cheol; Ko, Ji-Hoon; Bae, Byeong-Soo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.14, no.9, pp.375 - 379, 2011 |
Grain boundary incorporation of interstitial oxygen in polycrystalline Si film by plasma oxidation and its effect on thin film transistors Kim, BH; Lee, SR; Ahn, KM; Ahn, Byung Tae, ELECTRONIC MATERIALS LETTERS, v.4, no.2, pp.45 - 49, 2008-06 |
High Stability InGaZnO4 Thin-Film Transistors Using Sputter-Deposited PMMA Gate Insulators and PMMA Passivation Layers Kim, Dong-Hun; Choi, Seung-Hoon; Cho, Nam-Gyu; Chang, Young-Eun; Kim, Ho-Gi; Hong, Jae-Min; Kim, Il-Doo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.8, pp.296 - 298, 2009 |
High-Performance Al-Sn-Zn-In-O Thin-Film Transistors: Impact of Passivation Layer on Device Stability Yang, Shinhyuk; Cho, Doo-Hee; Ryu, Min Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jang, Jin; Jeong, Jae Kyeong, IEEE ELECTRON DEVICE LETTERS, v.31, no.2, pp.144 - 146, 2010-02 |
Highly Condensed Epoxy-Oligosiloxane-Based Hybrid Material for Transparent Low-k Dielectric Coatings Yang, Seung-Cheol; Kwak, Seung-Yeon; Jin, Jung-Ho; Bae, Byeong-Soo, ACS APPLIED MATERIALS & INTERFACES, v.1, no.7, pp.1585 - 1590, 2009-07 |
Highly Efficient Vacuum-Evaporated CsPbBr3 Perovskite Light-Emitting Diodes with an Electrical Conductivity Enhanced PolymerAssisted Passivation Layer Kim, Nakyung; Shin, Mingue; Jun, Seongmoon; Choi, Bongjun; Kim, Joonyun; Park, Jinu; Kim, Hyunseung; et al, ACS APPLIED MATERIALS & INTERFACES, v.13, no.31, pp.37313 - 37320, 2021-08 |
Hydrogen Defect Passivation of Silicon Transistor on Plastic for High Performance Flexible Device Application Hasan, Musarrat; Yun, Sun Jin; Koo, Jae Bon; Park, Sang Hee Ko; Kim, Yong Hae; Kang, Seung Youl; Rho, Jonghyun; et al, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.13, no.3, pp.80 - 82, 2010 |
Improvement in the photon-induced bias stability of Al-Sn-Zn-In-O thin film transistors by adopting AlOx passivation layer Yang, Shinhyuk; Cho, Doo-Hee; Ryu, Min Ki; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jang, Jin; Jeong, Jae Kyeong, APPLIED PHYSICS LETTERS, v.96, no.21, 2010-05 |
Influence of Cu on the Passivation Behavior of Fe-20Cr-xCu (x=0, 2, 4 wt%) Alloys in Sulfuric Acid Solution Oh, Kkoch-Nim; Toor, Ihsan-ul-Haq; Ahn, Soo-Hoon; Kwon, Hyuk-Sang, CORROSION, v.69, no.6, pp.560 - 567, 2013-06 |
Origin and passivation of fixed charge in atomic layer deposited aluminum oxide gate insulators on chemically treated InGaAs substrates Shin, Byungha; Weber, Justin R.; Long, Rathnait D.; Hurley, Paul K.; Van de Walle, Chris G.; McIntyre, Paul C., APPLIED PHYSICS LETTERS, v.96, no.15, 2010-04 |
Strategies to Reduce the Open-Circuit Voltage Deficit in Cu2ZnSn(S,Se)(4) Thin Film Solar Cells Kim, Jekyung; Shin, Byungha, ELECTRONIC MATERIALS LETTERS, v.13, no.5, pp.373 - 392, 2017-09 |
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