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| Microstructural Characterization of High Indium-Composition InXGa1-XN Epilayers Grown on c-Plane Sapphire Substrates Jeong, Myoungho; Lee, Hyo Sung; Han, Seok Kyu; Eun-Jung-Shin; Hong, Soon-Ku; Lee, JeongYong; Park, Yun Chang; et al, MICROSCOPY AND MICROANALYSIS, v.19, pp.145 - 148, 2013-08 |
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