Browse "MS-Journal Papers(저널논문)" by Subject medium energy ion scattering spectroscopy
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| A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon Kim, YP; Choi, Si-Kyung; Ha, YH; Kim, Sehun; Kim, HK; Moon, DW, APPLIED SURFACE SCIENCE, v.117, pp.207 - 211, 1997-06 |
| Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopy Moon, DW; Ha, YH; Kim, HK; Kim, KJ; Kim, HS; Lee, JeongYong; Kim, Sehun, APPLIED SURFACE SCIENCE, v.150, no.1-4, pp.235 - 243, 1999-08 |
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