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Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders Choi, Pyuck-Pa; Al-Kassab, Tala'at; Kwon, Young-Soon; Kim, Ji-Soon; Kirchheim, Reiner, MICROSCOPY AND MICROANALYSIS, v.13, no.5, pp.347 - 353, 2007-10 |
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