Browse "MS-Journal Papers(저널논문)" by Subject atomic force microscope (AFM)

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1
Nano-tribological characteristics of PZT thin film investigated by atomic force microscopy

Chung, Koo-Hyun; Lee, Yong-Ha; Kim, Young-Tae; Kim, Dae-Eun; Yoo, Jingyoo; Hong, Seungbum, SURFACE & COATINGS TECHNOLOGY, v.201, no.18, pp.7983 - 7991, 2007-06

2
Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, S, IEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02

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