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Novel Electronics for Flexible and Neuromorphic Computing Lee, Haneol; Park, Jung Hwan; Kim, Tae Jin; Im, Doyoung; Shin, Jung Ho; Kim, Do Hyun; Mohammad, Baker; et al, ADVANCED FUNCTIONAL MATERIALS, v.28, no.32, 2018-08 |
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
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