Browse "MS-Journal Papers(저널논문)" by Subject NiSi
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| Characterization of low-temperature stress hump in relation to phase formation sequence of nickel silicide Hong, JE; Byun, JS; Kim, SI; Ahn, Byung Tae, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.44, pp.145 - 146, 2005-01 |
| Characterization of Low-Temperature Stress Hump in Relation to Phase Formation Sequence of Nickel Silicide Hong, Jeon Eui; Byun, Jeong Soo; Kim, Sun Il; Ahn, Byung Tae, Japanese Journal of Applied Physics, Vol.44, No.1A, pp.145-146, 2005 |
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