Browse "MS-Journal Papers(저널논문)" by Subject EPITAXIAL LAYER
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| Annihilation Behavior of Planar Defects on Phosphorus-Doped Silicon at Low Temperatures Im, Dong Hyun; Kim, Yong In; Jeong, Myoungho; Park, Kwang Wuk; Kim, Sung Kyu; Yuk, Jong Min; Nam, Woo Hyun; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.5, pp.3370 - 3374, 2017-05 |
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