Browse "MS-Journal Papers(저널논문)" by Subject Atom-probe tomography (APT)
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| Characterization of Grain Boundaries in Cu(In,Ga)Se-2 Films Using Atom-Probe Tomography Cojocaru-Miredin, Oana; Choi, Pyuck-Pa; Abou-Ras, Daniel; Schmidt, Sebastian S.; Caballero, Raquel; Raabe, Dierk, IEEE JOURNAL OF PHOTOVOLTAICS, v.1, no.2, pp.207 - 212, 2011-10 |
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