Browse "MS-Journal Papers(저널논문)" by Author Yeo, Im Gyu
Showing results 1 to 1 of 1
| Characterization of basal plane dislocations in PVT-grown SiC by transmission electron microscopy Jeong, Myoungho; Kim, Dong-Yeob; Hong, Soon-Ku; Lee, Jeong Yong; Yeo, Im Gyu; Eun, Tai-Hee; Chun, Myoung-Chuel, KOREAN JOURNAL OF MATERIALS RESEARCH, v.26, no.11, pp.656 - 661, 2016-11 |
Discover
Open Access
- 265 OA Article
Date issued
- 1,015 2020 - 2024
- 2,625 2010 - 2019
- 2,168 2000 - 2009
- 1,240 1990 - 1999
- 179 1980 - 1989