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1
Abnormal Thermal Instability of Al-InSnZnO Thin-Film Transistor by Hydroxyl-Induced Oxygen Vacancy at SiOx/Active Interface

Jeon, Guk-Jin; Yang, Junghoon; Lee, Seung Hee; Jeong, Wooseok; Park, Sang-Hee Ko, IEEE ELECTRON DEVICE LETTERS, v.42, no.3, pp.363 - 366, 2021-03

2
Active-matrix micro-light-emitting diode displays driven by monolithically integrated dual-gate oxide thin-film transistors

Yang, Junghoon; Park, HyunWoo; Kim, Baul; Cho, Yong-Hoon; Park, Sang-Hee Ko, JOURNAL OF MATERIALS CHEMISTRY C, v.10, no.26, pp.9699 - 9706, 2022-07

3
Highly Sensitive Mutual-Capacitive Fingerprint Sensor With Reference Electrode

Yang, Junghoon; Oh, Yeon-Wha; Siracosit, Sarawut; Park, Hyunwoo; Lee, Jungmoo; Kim, Sang Gyun; Kim, Hanbyul; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.11, pp.1973 - 1976, 2022-11

4
Trench-Structured High-Current-Driving Aluminum-Doped Indium-Tin-Zinc Oxide Semiconductor Thin-Film Transistor

Kim, Do Hyung; Lee, Kwang-Heum; Lee, Seung Hee; Kim, Junsung; Yang, Junghoon; Kim, Jingyu; Cho, Seong-In; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.10, pp.1677 - 1680, 2022-10

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