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Investigation of the Low-Frequency Noise Behavior and Its Correlation with the Subgap Density of States and Bias-Induced Instabilities in Amorphous InGaZnO Thin-Film Transistors with Various Oxygen Flow Rates Jeong, Chan-Yong; Park, Ick-Joon; Cho, In-Tak; Lee, Jong-Ho; Cho, Euo-Sik; Ryu, Min Ki; Park, Sang-Hee Ko; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.10, 2012-10 |
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