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1
Drain bias effect on the instability of amorphous indium gallium zinc oxide thin film transistor

Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Seo, Jong-Hyun; Yang, Shinhyuk; Park, Sang-Hee Ko, THIN SOLID FILMS, v.547, no.29, pp.263 - 266, 2013-11

2
Light and bias stability of a-IGZO TFT fabricated by r.f. magnetron sputtering

Huh, Jun-Young; Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Lee, Kang-Woong; Seo, Jong-Huyn; et al, CURRENT APPLIED PHYSICS, v.11, no.5, pp.49 - 53, 2011-09

3
Negative Gate Bias and Light Illumination-Induced Hump in Amorphous InGaZnO Thin Film Transistor

Jeon, Jae-Hong; Seo, Seung-Bum; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Kee-Chan; Park, Sang-Hee Ko, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.11, pp.7535 - 7539, 2013-11

4
Stability of a-InGaZnO thin film transistor under pulsed gate bias stress

Seo, Seung-Bum; Jeon, Jae-Hong; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Sang-Hee Ko, THIN SOLID FILMS, v.521, pp.212 - 215, 2012-10

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