Browse "MS-Journal Papers(저널논문)" by Author Rossow, U.
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| Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, Pyuck-Pa; Raabe, D.; Hoffmann, L.; Joenen, H.; et al, APPLIED PHYSICS LETTERS, v.102, no.13, 2013-04 |
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