Browse "MS-Journal Papers(저널논문)" by Author Ramasse, QM

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Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC

Kueck, AM; Kim, Do Kyung; Ramasse, QM; De Jonghe, LC; Ritchie, RO, NANO LETTERS, v.8, pp.2935 - 2939, 2008-09

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