Showing results 1 to 5 of 5
A simulation model for thickness profile of the film deposited using planar circular type magnetron sputtering sources Hong, Daniel Seungbum; Kim, E; Bae, Byeong-Soo; No, Kwangsoo; Lim, SC; Woo, SG; Koh, YB, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.14, no.5, pp.2721 - 2727, 1996-09 |
Bonding Quality of Copper-Nickel Fine Clad Metal Prepared by Surface Activated Bonding Kim, KH; Hong, Soon-Hyung; Cha, SI; Lim, SC; Kwon, HC; Yoon, WK, MATERIALS TRANSACTIONS, v.51, pp.787 - 792, 2010-04 |
Effects of gas ring position and mesh introduction on film quality and thickness uniformity Hong, Daniel Seungbum; Kim, E; Jiang, ZT; Bae, Byeong-Soo; No, Kwangsoo; Lim, SC; Woo, S; et al, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.45, no.1-3, pp.98 - 101, 1997-03 |
Optical property simulation of single-layer halftone phaseshifting masks for DUV microlithography Jiang, ZT; Hong, Daniel Seungbum; Kim, E; Bae, Byeong-Soo; No, Kwangsoo; Hwangbo, CK; Lim, SC; et al, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.11, no.10, pp.1450 - 1455, 1996-10 |
Water-induced degradation of chromium fluoride films Kim, EN; Hong, Daniel Seungbum; Gorman, JD; Lim, SC; Moon, SY; Kim, DW; No, Kwangsoo, THIN SOLID FILMS, v.324, no.1-2, pp.292 - 299, 1998-07 |
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