Showing results 1 to 1 of 1
Microstructural characterization of polycrystalline Si films grown by vapor-induced crystallization of amorphous Si using Al/Ni chloride Eom, Ji Hye; Lee, Kye Ung; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.3, pp.194 - 197, 2007 |
Discover