Browse "MS-Journal Papers(저널논문)" by Author Cagnon, J.
Showing results 1 to 1 of 1
| Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors Long, R. D.; Shin, B.; Monaghan, S.; Cherkaoui, K.; Cagnon, J.; Stemmer, S.; McIntyre, P. C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.158, no.5, pp.103 - 107, 2011 |
Discover
Open Access
- 264 OA Article
Date issued
- 996 2020 - 2024
- 2,625 2010 - 2019
- 2,168 2000 - 2009
- 1,240 1990 - 1999
- 179 1980 - 1989