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Electrical, structural and optical characterization of copper oxide thin films as a function of post annealing temperature Figueiredo, V; Elangovan, E; Goncalves, G; Franco, N; Alves, E; Park, Sang-Hee ko; Martins, R; et al, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.206, no.9, pp.2143 - 2148, 2009-09 |
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