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Thermal stability of the exchanged biased CoFe/IrMn electrode for the magnetic tunnel junction as a function of CoFe thickness Lee, JH; Kim, SJ; Yoon, CS; Kim, CK; Park, Byong Guk; Lee, Taek Dong, JOURNAL OF APPLIED PHYSICS, v.92, no.10, pp.6241 - 6244, 2002-11 |
Tunnel spin polarization of Ni80Fe20/SiO2 probed with a magnetic tunnel transistor Park, Byong Guk; Banerjee, T; Min, BC; Lodder, JC; Jansen, R, PHYSICAL REVIEW B, v.73, no.17, 2006-05 |
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