Showing results 2 to 2 of 2
Transition of dominant instability mechanism depending on negative gate bias under illumination in amorphous In-Ga-Zn-O thin film transistor Oh, Himchan; Yoon, Sung-Min; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Park, Sang-Hee Ko, APPLIED PHYSICS LETTERS, v.98, no.3, 2011-01 |
Discover