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Performance Enhancement of Electronic and Energy Devices via Block Copolymer Self-Assembly Yoo, Hyeon Gyun; Byun, Myunghwan; Jeong, Chang Kyu; Lee, Keon Jae, ADVANCED MATERIALS, v.27, no.27, pp.3982 - 3998, 2015-07 |
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
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