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Highly Reliable Magnetic Memory-Based Physical Unclonable Functions Kang, Jaimin; Han, Donghyeon; Lee, Kyungchul; Ko, San; Koh, Daekyu; Park, Chando; Ahn, Jaesoo; et al, ACS NANO, v.18, no.20, pp.12853 - 12860, 2024-05 |
The Influence of Capping Layers on Tunneling Magnetoresistance and Microstructure in CoFeB/MgO/CoFeB Magnetic Tunnel Junctions upon Annealing Kim, Geunwoo; Lee, Soogil; Lee, Sanghwa; Song, Byonggwon; Lee, Byung-Kyu; Lee, Duhyun; Lee, Jin Seo; et al, NANOMATERIALS, v.13, no.18, 2023-09 |
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