Showing results 1 to 4 of 4
Effect of thermal annealing on microstructural properties of Ti/Ge2Sb2Te5/Ti thin films deposited on SiO2/Si substrates by a sputtering method Kim, SY; Lee, HS; Chung, IS; Park, YJ; Lee, JeongYong; Kim, TW, APPLIED SURFACE SCIENCE, v.253, no.8, pp.4041 - 4044, 2007-02 |
Investigation of electrical characteristics of the In3Sb1Te2 ternary alloy for application in phase-change memory Kim, ET; Lee, JeongYong; Kim, YT, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.3, pp.103 - 105, 2009-05 |
Metalorganic chemical vapor deposition of non-GST chalcogenide materials for phase change memory applications Ahn, Jun-Ku; Park, Kyoung-Woo; Hur, Sung-Gi; Seong, Nak-Jin; Kim, Chung-Soo; Lee, Jeong-Yong; Yoon, Soon-Gil, JOURNAL OF MATERIALS CHEMISTRY, v.20, no.9, pp.1751 - 1754, 2010 |
Structural Properties of Phase-Change InSbTe Thin Films Grown at a Low Temperature by Metalorganic Chemical Vapor Deposition Ahn, Jun-Ku; Park, Kyoung-Woo; Hur, Sung-Gi; Kim, Chung-Soo; Lee, Jeong-Yong; Yoon, Soon-Gil, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.1, pp.189 - 194, 2011-01 |
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