Showing results 1 to 7 of 7
Characterization of CeO2 thin films as insulator of metal ferroelectric insulator semiconductor (MFIS) structures Song, HW; Lee, CS; Kim, DG; No, Kwangsoo, THIN SOLID FILMS, v.368, no.1, pp.61 - 66, 2000 |
Contraction stress build-up of anisotropic conductive films (ACFs) for flip-chip interconnection: Effect of thermal and mechanical properties of ACFs Kwon, WS; Paik, Kyung-Wook, JOURNAL OF APPLIED POLYMER SCIENCE, v.93, no.6, pp.2634 - 2641, 2004-09 |
Platinum (100) hillock growth in Pt/Ti electrode stack for SrBi2Ta2O9 ferroelectric random access memory Jung, WW; Choi, Si-Kyung; Kweon, SY; Yeom, SJ, JOURNAL OF ELECTROCERAMICS, v.13, no.1-3, pp.55 - 63, 2004-07 |
Residual stress effect on self-annealing of electroplated copper Lee, CH; Park, Chong-Ook, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.42, no.7, pp.4484 - 4488, 2003-07 |
Residual stress measurements in electroless plated Ni-P films Song, JY; Yu, Jin, THIN SOLID FILMS, v.415, no.1-2, pp.167 - 172, 2002-08 |
Strength versus ductility in carbon nanotube reinforced nickel matrix nanocomposites Borkar, Tushar; Hwang, Jaewon; Hwang, Jun Yeon; Scharf, Thomas W.; Tiley, Jaimie; Hong, Soon Hyung; Banerjee, Rajarshi, JOURNAL OF MATERIALS RESEARCH, v.29, no.6, pp.761 - 769, 2014-03 |
The effect of stress on solid-phase epitaxial regrowth in As+-implanted two-dimensional amorphized Si Shin, YG; Lee, JeongYong; Park, MH; Kang, HK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.11, pp.6192 - 6197, 2001-11 |
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