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Characterization of the Property Degradation of PZT Thin Films with Thickness Song, Han Wook; No, Kwangsoo, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.58, no.4, pp.809 - 816, 2011-04 |
Dependence of ferroelectricity on film thickness in nano-scale Pb(Zr,Ti)O3 thin films Hong, J.; Song, H.W.; Choi, J.; Kim, S.K.; Kim, Y.; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.68, no.0, pp.157 - 167, 2004 |
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