Showing results 1 to 2 of 2
Data Storage Systems Based on Atomic Force Microscopy No, Kwangsoo; Shin, H; Hong, S; Woo, J; Jeon, JU; Pak, YE, The joint symposium of the Asian Symposium on Organized Molecular Films for Electronics and Photonics and the 11th Molecular Electronics and Devices Symposium, pp.O-4 -, 2000-07-10 |
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14 |
Discover