Browse "MS-Conference Papers(학술회의논문)" by Author Jang, W
Showing results 1 to 2 of 2
| Determination of stress-strain curve for microelectronic solder joint by ESPI measurement and FE analysis Lee, BW; Jeong, JH; Jang, W; Kim, JY; Kim, DW; Kwon, D; Nah, JW; et al, The Third International Conference On Advanced Materials Development and Performance, v.17, pp.1983 - 1988, The Third International Conference On Advanced Materials Development and Performance, 2003 |
| Evaluation of Thermal Shear Strains in Flips-chip Package by Electronic Speckle Pattern Interferometry (ESPI) Jang, W; Lee, BW; Kim, DW; Nah, JW; Paik, Kyung-Wook; Kwon, D, Proceeding of the 3rd International Symposium on Electronic Materials and Packaging 2001, pp.310 - 314, 2001-11 |
Discover
Type
- 12 Article
- 1 Book
- 7,308 Conference
Date issued
- 691 2020 - 2023
- 2,574 2010 - 2019
- 2,236 2000 - 2009
- 1,492 1990 - 1999
- 318 1980 - 1989