Showing results 1 to 4 of 4
Degradation mechanism of low voltage cathodoluminescence of ZnS : Ag,Cl phosphors screen under the panel sealing process Park, ZM; Jeon, DukYoung; Cha, SN; Jin, YW; Kim, JM, Proceedings of the 14th International Vacuum Microelectronics Conference, pp.197 - 198, International Vacuum Microelectronics Conference, 2001-08-12 |
Difference in degradation behavior between ZnS:Ag,Cl and ZnS:Cu,Al phosphor screens under the panel sealing temperature Jeon, Duk Young; Park, ZM; Cha, SN; Jin, YW; Kim, JM, International Display Manufacturing Conference, pp.285 - 288, 2002-01-29 |
Effects of FED Panel Packaging Process on the Propoerties of Phosphor Screen Jeon, Duk Young; Park, ZM; Cha, SN; Jin, YW; Kim, JM, International Vacuum Mircoelectronics Conference, pp.186 - 187, 2000 |
Effects of the field emission display panel sealing process on the cathodoluminescence properties of phosphor screen Park, ZM; Jeon, Duk Young; Jin, YW; Cha, SN; Kim, JM, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.999 - 1003, 2000-08-14 |
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