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NO	Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1	Estimating parameters of the power law process with two measures of failure time Ahn, Chang-Won; Chae, Kyung-Chul; Clark, Gordon M., JOURNAL OF QUALITY TECHNOLOGY, v.30, no.2, pp.127 - 132, 1998-04
2	Due-date based scheduling and control policies in a multiproduct semiconductor wafer fabrication facility Kim, Yeong-Dae; Kim, JU; Lim, SK; Jun, HB, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.11, no.1, pp.155 - 164, 1998-02
3	A simulation study on lot release control, mask scheduling, and batch scheduling in semiconductor wafer fabrication facilities Kim, Yeong-Dae; Lee, DH; Kim, JU; Roh, HK, JOURNAL OF MANUFACTURING SYSTEMS, v.17, no.2, pp.107 - 117, 1998

Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)

Ahn, Chang-Won; Chae, Kyung-Chul; Clark, Gordon M., JOURNAL OF QUALITY TECHNOLOGY, v.30, no.2, pp.127 - 132, 1998-04

Kim, Yeong-Dae; Kim, JU; Lim, SK; Jun, HB, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.11, no.1, pp.155 - 164, 1998-02

Kim, Yeong-Dae; Lee, DH; Kim, JU; Roh, HK, JOURNAL OF MANUFACTURING SYSTEMS, v.17, no.2, pp.107 - 117, 1998

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