Search

Start a new search
Current filters:
Add filters:
  • Results/Page
  • Sort items by
  • In order
  • Authors/record

Results 1-6 of 6 (Search time: 0.008 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Estimating parameters of the power law process with two measures of failure time

Ahn, Chang-Won; Chae, Kyung-Chul; Clark, Gordon M., JOURNAL OF QUALITY TECHNOLOGY, v.30, no.2, pp.127 - 132, 1998-04

2
Periodic Wear-Limit Replacement with Wear-Dependent Failures

Park, Kyung Soo, MICROELECTRONICS RELIABILITY, v.37, no.3, pp.467 - 472, 1996-01

3
An integrated approach to dynamic plant location and capacity planning

Lim, SK; Kim, Yeong-Dae, JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, v.50, no.12, pp.1205 - 1216, 1999-12

4
Due-date based scheduling and control policies in a multiproduct semiconductor wafer fabrication facility

Kim, Yeong-Dae; Kim, JU; Lim, SK; Jun, HB, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.11, no.1, pp.155 - 164, 1998-02

5
A simulation study on lot release control, mask scheduling, and batch scheduling in semiconductor wafer fabrication facilities

Kim, Yeong-Dae; Lee, DH; Kim, JU; Roh, HK, JOURNAL OF MANUFACTURING SYSTEMS, v.17, no.2, pp.107 - 117, 1998

6
Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition

Park, JI; Yum, Bong-Jin, ENGINEERING OPTIMIZATION, v.28, no.3, pp.199 - 230, 1997

rss_1.0 rss_2.0 atom_1.0