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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring Kim, Min; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.36, no.1, pp.11 - 20, 2009 | |
Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring Kim, Min; Yum, Bong-Jin, STATISTICAL PAPERS, v.52, no.2, pp.327 - 342, 2011-05 | |
Optimal design of accelerated life tests under modified stress loading methods Park, SJ; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.25, no.1, pp.41 - 62, 1998-02 | |
Optimal design of accelerated life tests with two stresses Park, JW; Yum, Bong-Jin, NAVAL RESEARCH LOGISTICS, v.43, no.6, pp.863 - 884, 1996-09 | |
Comparisons of exponential life test plans with intermittent inspections Kim, SH; Yum, Bong-Jin, JOURNAL OF QUALITY TECHNOLOGY, v.32, no.3, pp.217 - 230, 2000-07 | |
Planning performance degradation tests - A review Yum, Bong-Jin; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12 |
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