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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Selection between Weibull and lognormal distributions: A comparative simulation study Kim, Jin Seon; Yum, Bong-Jin, COMPUTATIONAL STATISTICS DATA ANALYSIS, v.53, no.2, pp.477 - 485, 2008-12 | |
| Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring Kim, Min; Yum, Bong-Jin, JOURNAL OF APPLIED STATISTICS, v.36, no.1, pp.11 - 20, 2009 | |
| A Loss Function Approach for Multi-characteristic Parameter Design Lee, PalHun; Yum, Bong-Jin, JOURNAL OF ENGINEERING VALUATION AND COST ANALYSIS, v.3, no.0, pp.277 - 289, 2000-01 | |
| Experimental Determination of Uncertainty Importances for Monotonic Systems Yum, Bong-Jin; Jae-Gyeun Cho; Young-Sang Kim, ASIA PACIFIC MANAGEMENT REVIEW, v.6, no.2, pp.217 - 239, 2001-07 | |
| Comparisons of exponential life test plans with intermittent inspections Kim, SH; Yum, Bong-Jin, JOURNAL OF QUALITY TECHNOLOGY, v.32, no.3, pp.217 - 230, 2000-07 | |
| Planning performance degradation tests - A review Yum, Bong-Jin; Lim, H; Seo, SK, INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.14, pp.372 - 381, 2007-12 | |
| Development of a dual burn-in policy for semiconductor products based on the number of defective neighborhood chips Tong S.H.; Yum, Bong-Jin, INTERNATIONAL JOURNAL OF RELIABILITY, QUALITY AND SAFETY ENGINEERING, v.13, no.6, pp.501 - 525, 2006-12 | |
| Functional estimation of activity criticality indices and sensitivity analysis of expected project completion time Cho, JG; Yum, Bong-Jin, JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, v.55, pp.850 - 859, 2004-08 | |
| Optimal Design of Step-Stress Degradation Tests in the Case of Destructive Measurement Park, Sang-Jun; Yum, Bong-Jin; S. Balamurali, QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, v.1, no.1, pp.105 - 124, 2004 | |
| Multi-characteristics parameter design: A Desirability function approach based on process capability indices PAL HUN LEE; Yum, Bong-Jin, INTERNATIONAL JOURNAL OF RELIABILITY, QUALITY, AND SAFETY ENGINEERING, v.10, no.4, pp.445 - 461, 2003 |
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